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SNJ54BCT8374AFK

零件编号 SNJ54BCT8374AFK
产品分类 专业逻辑
制造商 Texas Instruments
描述 SCAN TEST DEVICES WITH OCTAL D-T
封装
包装 管子
数量 0
RoHS 状态 YES
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产品参数
产品说明
PDF(1)
类型描述
制造商Texas Instruments
系列54BCT
包装管子
产品状态ACTIVE
包装/箱28-CLCC
安装类型Surface Mount
位数8
逻辑类型Scan Test Device with D-Type Edge-Triggered Flip-Flops
工作温度-55°C ~ 125°C
电源电压4.5V ~ 5.5V
供应商设备包28-LCCC (11.43x11.43)

Panasonic Electronic Components
RES SMD 1.1K OHM 5% 1/8W 0805
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RES SMD 2.4K OHM 5% 1/8W 0805
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RES SMD 1.5K OHM 5% 1/8W 0805
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RES SMD 3K OHM 5% 1/8W 0805
Roving Networks (Microchip Technology)
IC EEPROM 1KBIT MICROWIRE 8SOIC
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SENSOR OPT REFLECTIVE 5MM 5DIP
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RES 68 OHM 5% 3W AXIAL
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RES 560 OHM 5% 3W AXIAL
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RES 5.1K OHM 5% 3W AXIAL
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RES 43K OHM 5% 3W AXIAL
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